Advanced mixed-mode bending test: A rapid, inexpensive and accurate method for fracture-mechanical interface characterisation

Author:

Wunderle B.1,Schulz M.1,Keller J.2,Maus I.3,Pape H.3,Michel B.4

Affiliation:

1. Chemnitz University of Technology, Reichenhainer Str. 70, 09126, Germany

2. Angewandte Micro-Messtechnik GmbH, Volmerstr. 9 b, 12489 Berlin, Germany

3. Infineon Technologies AG, Am Campeon 1-12, 85579 Neubiberg, Germany

4. Fraunhofer Institute Electronic Nanosystems ENAS, Technologie-Campus 3, 09126 Chemnitz, Germany

Publisher

IEEE

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Characterization and simulation of delamination on package-level considering sub-critical interfacial fracture-parameters under cyclic loading.;2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2023-04-17

2. Determining adhesion of critical interfaces in microelectronics – A reverse Finite Element Modelling approach based on nanoindentation;Microelectronics Reliability;2022-06

3. Characterization of interfacial parameters for lifetime modelling in modern optical sensor package assemblies;2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2022-04-25

4. Design of a BIST implemented AES crypto-processor ASIC;PLOS ONE;2021-11-16

5. Experimental determination of critical adhesion energies with the Advanced Button Shear Test;Microelectronics Reliability;2019-08

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