A direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration-Reference-Cited by-同舟云学术

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A direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration

Published:1995-05 Issue:5 Volume:42 Page:963-968
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Chan D.S.H.,Ong V.K.S.,Phang J.C.H.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx1/16/8655/00381995.pdf?arnumber=381995

Cited by 48 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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