Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference24 articles.
1. Scanning electron microscope characterization of gap redemitting diodes;Hackett;J. Appl. Phys.,1972
2. On the analysis of diffusion length measurements by SEM;Donolato;Solid State Electron.,1982
3. A SEM-EBIC minority-carrier diffusion-length measurement technique;Ioannou;IEEE Trans. Electron. Devices,1982
4. Semiconductor Material and Device Characterization;Schroder,2006
5. Generalized EBIC method for extracting diffusion lengths from non-conventional collector structure;Kurniawan,2006
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