Application of Island Thin Films for Microelectronics Devices
Author:
Affiliation:
1. Bauman Moscow State Technical University,Electronic Technologies in Mechanical Engineering Department,Moscow,Russian Federation
Funder
Bauman Moscow State Technical University
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10086702/10086686/10086877.pdf?arnumber=10086877
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1. Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects
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3. Problems and Solutions of Automation of Magnetron Sputtering Process in Vacuum
4. SiO2 layer effect on atomic layer deposition Al2O3-based resistive switching memory
5. Poole-Frenkel Effect and Schottky Effect in Metal-Insulator-Metal Systems
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