Author:
Oyeniran Adeboye Stephen,Ubar Raimund,Jenihhin Maksim,Raik Jaan
Cited by
4 articles.
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1. BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-11
2. Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries;2022 IEEE 40th VLSI Test Symposium (VTS);2022-04-25
3. Test vector generation and testing of TMS320C6745 DSP for Launch Vehicle Applications;2022 First International Conference on Electrical, Electronics, Information and Communication Technologies (ICEEICT);2022-02-16
4. Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement;2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS);2021-06-28