Author:
Cantoro Riccardo,Girard Patrick,Masante Riccardo,Sartoni Sandro,Reorda Matteo Sonza,Virazel Arnaud
Cited by
6 articles.
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1. Self-Test Library Generation for In-Field Test of Path Delay Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. Evaluating the Impact of Aging on Path-Delay Self-Test Libraries;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
3. Recent Trends and Perspectives on Defect-Oriented Testing;2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS);2022-09-12
4. A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers;Electronics;2022-08-09
5. Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries;2022 IEEE European Test Symposium (ETS);2022-05-23