Inversion MOS capacitance extraction for high-leakage dielectrics using a transmission line equivalent circuit-Reference-Cited by-同舟云学术

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Inversion MOS capacitance extraction for high-leakage dielectrics using a transmission line equivalent circuit

Published:2000-09 Issue:9 Volume:21 Page:454-456
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Barlage D.W.,O'Keeffe J.T.,Kavalieros J.T.,Nguyen M.M.,Chau R.S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/18702/00863109.pdf?arnumber=863109

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