Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
14 articles.
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1. A Multi-Objective Evolutionary Approach for Test Network Design;2024 IEEE European Test Symposium (ETS);2024-05-20
2. RC-IJTAG: A Methodology for Designing Remotely-Controlled IEEE 1687 Scan Networks;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
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4. Machine Learning Support for Diagnosis of Analog Circuits;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22
5. IEEE P1687.1: Extending the Network Boundaries for Test;2022 IEEE International Test Conference (ITC);2022-09