On Reducing Scan Shift Activity at RTL-Reference-Cited by-同舟云学术

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On Reducing Scan Shift Activity at RTL

Published:2010-07 Issue:7 Volume:29 Page:1110-1120
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Alpaslan Elif,Huang Yu,Lin Xijiang,Cheng Wu-Tung,Dworak Jennifer

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx5/43/5487456/05487476.pdf?arnumber=5487476

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability;IEEE Transactions on Circuits and Systems II: Express Briefs;2022-02

3. Efficient Low-power Scan Test Method based on Exclusive Scan and Scan Chain Reordering;JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE;2020-08-31

4. A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test;IEEE Journal on Emerging and Selected Topics in Circuits and Systems;2018-09

5. Time-Multiplexed 1687-Network for Test Cost Reduction;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2018-08

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