Handling Stuck-at-Fault Defects Using Matrix Transformation for Robust Inference of DNNs
Author:
Funder
NSF
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Link
https://ieeexplore.ieee.org/ielam/43/9204502/8852740-aam.pdf
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