Handling Stuck-at-Fault Defects Using Matrix Transformation for Robust Inference of DNNs

Author:

Zhang BaogangORCID,Uysal NecatiORCID,Fan Deliang,Ewetz Rickard

Funder

NSF

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

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