Funder
Semiconductor Research Corporation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
9 articles.
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1. Transferable Graph Neural Network-Based Delay-Fault Localization for Monolithic 3-D ICs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. Storage-Based Logic Built-In Self-Test With Partitioned Deterministic Compressed Tests;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-09
3. Storage-Based Logic Built-In Self-Test With Cyclic Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-09
4. Storage and Counter Based Logic Built-In Self-Test;IEEE Access;2023
5. Minimum Power Test Pattern Generator for Testing VLSI Circuits;2022 6th International Conference on Devices, Circuits and Systems (ICDCS);2022-04-21