Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions

Author:

Kong YachenORCID,Zhang MengORCID,Zhan XuepengORCID,Cao Rui,Chen JiezhiORCID

Funder

China Key Research and Development Program

National Natural Science Foundation of China

Joint Fund for Intelligent Computing of Shandong Natural Science Foundation

Fundamental Research Funds of Shandong University

Postdoctoral Innovative Talents Support Program

China Postdoctoral Science Foundation

Excellent Projects for Postdoctoral Science and Technology Activities in Hubei Province

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

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