Research on UFS Endurance Test and Life Prediction Method based on Back-Propagation Neural Network-Reference-Cited by-同舟云学术

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Research on UFS Endurance Test and Life Prediction Method based on Back-Propagation Neural Network

Published:2023-10-12 Issue: Volume: Page:1-6
ISSN:
Container-title:2023 Global Reliability and Prognostics and Health Management Conference (PHM-Hangzhou)
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Author:

Shi Ying¹,Yang Shaohua¹,Wu Fugen¹,Dong Huafeng²,Luo Rongde¹

Affiliation:

1. School of Materials and Energy, Guangdong University of Technology,State Key Laboratory of Precision Electronic Manufacturing, Technology and Equipment,Guangzhou,P.R. China

2. School of Physics and Optoelectronic Engineering, Guangdong University of Technology,Guangzhou,P.R. China

Funder

National Natural Science Foundation of China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10482420/10482375/10482779.pdf?arnumber=10482779

Reference13 articles.

1. Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis

2. Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions

3. Temperature Effects in NAND Flash Memories: A Comparison Between 2-D and 3-D Arrays

4. Cycling-Induced Charge Trapping/Detrapping in Flash Memories—Part I: Experimental Evidence

5. An SVM-Based NAND Flash Endurance Prediction Method

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