Author:
Han L.-K.,Vollertsen R.-P.,Nowak E.J.,Wu E.Y.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
43 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Absorption Markov Lifetime Evaluation Model Based on Weibull Distribution;2022 10th International Symposium on Next-Generation Electronics (ISNE);2023-05-12
2. Variability in Resistive Memories;Advanced Intelligent Systems;2023-03-14
3. Semantic Autoencoder for Modeling BEOL and MOL Dielectric Lifetime Distributions;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03
4. A Realistic Modeling Approach To Explain the Physical Mechanism of TDDB For Automotive Grade-Zero Applications;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03
5. Study of Layout effect on Gate oxide TDDB in sub-16nm FinFET technology;2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2021-09-15