Feasibility Analysis of Chip-to-Module Channel Operating at 212 Gbps

Author:

de Paulis Francesco1,Rabinovich Rick2,Mellitz Richard3,Resso Mike4

Affiliation:

1. University of L’Aquila,L’Aquila,Italy

2. Keysight Technologies Calabasas (CA),USA

3. Samtec Corporation Columbia (SC),USA

4. Keysight Technologies Santa Rosa (CA),USA

Publisher

IEEE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Impact of decoupling capacitor aging and temperature for the long-term reliability of power delivery networks;Journal of Power Electronics;2024-09-10

2. Channel Operating Margin Exploration as a Complementary Transceiver Circuit Design Tool for 25 Gbps PAM4 Serial Links;Ingeniería e Investigación;2024-05-29

3. Long-Term Reliability of PDN Design Based on Decap Aging and Temperature;2023 XXXVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS);2023-08-19

4. Bandwidth Limits of Connector Wipe Stub for Reliable 224 Gbps Signaling;2023 IEEE 27th Workshop on Signal and Power Integrity (SPI);2023-05-07

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