Long-Term Reliability of PDN Design Based on Decap Aging and Temperature
Author:
Affiliation:
1. University of L’Aquila,L’Aquila,Italy
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10265282/10265283/10265339.pdf?arnumber=10265339
Reference8 articles.
1. Probes and Setup for Measuring Power-Plane Impedances with Vector-Network Analyzer;novak;DesignCon 1999,0
2. High CV MLCC DC/AC bias ageing capacitance loss explained;zednicek;2nd PCNS Passive Components Networking Symposium,2019
3. A Methodical Approach for PCB PDN Decoupling Minimizing Overdesign with Genetic Algorithm Optimization
4. A Novel LVDC Superconducting Power Distribution System for Data Center With Power Quality Improvement and Loss Reduction
5. Determination of the effects for capacitor lifetime with Six Sigma DoE
Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Impact of decoupling capacitor aging and temperature for the long-term reliability of power delivery networks;Journal of Power Electronics;2024-09-10
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