Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results-Reference-Cited by-同舟云学术

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Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results

Published:2004-05 Issue:5 Volume:23 Page:737-757
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:en
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Hamdioui S.,Al-Ars Z.,van de Goor A.J.,Rodgers M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx5/43/28765/01291585.pdf?arnumber=1291585

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