Novel March WY Approach for Dynamic Fault Detection in Memory BIST-Reference-Cited by-同舟云学术

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Novel March WY Approach for Dynamic Fault Detection in Memory BIST

Published:2023-12-18 Issue: Volume:36 Page:516-521
ISSN:
Container-title:2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC)
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Author:

Loh Wan Ying¹,Lee Weng Fook²,Hussin Razaidi¹,Zakwan Jidin Aiman³,Ahmad Norhawati¹,Zakaria Nor Azura⁴

Affiliation:

1. Universiti Malaysia Perlis,Faculty of Electronic Engineering Technology,Arau,Malaysia

2. Emerald System Design Center,Penang,Malaysia

3. Universiti Teknikal Malaysia Melaka,Fakulti Teknologi Kejuruteraan Elektrik dan Elektronik,Durian Tunggal,Malaysia

4. UST Global Sdn Bhd,Semiconductor Department,Bayan Lepas,Malaysia

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10387741/10387791/10387891.pdf?arnumber=10387891

Reference18 articles.

1. Fault Detection and Analysis in embedded SRAM for sub nanometer technology

2. Performance Analysis of March M & B Algorithms for Memory Built-In Self-Test (BIST);Singh

3. SRAM Memory Built in Self-Test using MARCH Algorithm

4. MBIST Controller Based on March-ee Algorithm

5. A Novel March XR Algorithm, Design, and Test Architecture for Memories

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