Fault Detection and Analysis in embedded SRAM for sub nanometer technology-Reference-Cited by-同舟云学术

Fault Detection and Analysis in embedded SRAM for sub nanometer technology

Published:2022-05-09 Issue: Volume: Page:
ISSN:
Container-title:2022 International Conference on Applied Artificial Intelligence and Computing (ICAAIC)
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Author:

Maddela Venkatesham¹,Sinha Sanjeet Kumar²,Parvathi Muddapu²,Sharma Vinay³

Affiliation:

1. Lovely Professional University,Dept. of School of Electronics and Electrical Engineering,Phagwara,India

2. BVRIT HYDERABAD College of Engineering for Women,Department of Electronics and Communication Engineering,Hyderabad,India

3. ni2designs Pvt.Ltd,Pune,India

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9792618/9792586/09793265.pdf?arnumber=9793265

Reference19 articles.

1. Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution

2. Minimal March Tests for Detection of Dynamic Faults in Random Access Memories

3. Fault Detection with Optimum March Test Algorithm

4. Modified March C - Algorithm for Embedded Memory Testing

5. Study on Paradigm of Variable Length SRAM Embedded Memory Testing;venkatesham;Proceedings of the Fifth International Conference on Electronics Communication and Aerospace Technology (ICECA),0

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1. Novel March WY Approach for Dynamic Fault Detection in Memory BIST;2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC);2023-12-18

2. SRAM Memory Testing Methods and Analysis;Advances in Systems Analysis, Software Engineering, and High Performance Computing;2023-12-18

3. Modified March MSS for Unlinked Dynamic Faults Detection;2022 IEEE 20th Student Conference on Research and Development (SCOReD);2022-11-08