Author:
Li Xin,Le Jiayong,Celik Mustafa,Pileggi Lawrence T.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
8 articles.
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1. Statistical Modeling of Logic Gates and Flip-Flops for High Speed CMOS Circuits Applications;Silicon;2016-10-27
2. Statistical Criticality Computation Using the Circuit Delay;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2014-05
3. On Timing Model Extraction and Hierarchical Statistical Timing Analysis;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2013-03
4. Testability-Driven Statistical Path Selection;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2012-08
5. Methods of Parameter Variations;Process Variations and Probabilistic Integrated Circuit Design;2011-10-08