Author:
Czysz Dariusz,Mrugalski Grzegorz,Rajski Janusz,Tyszer Jerzy
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
15 articles.
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1. Low Cost Hypercompression of Test Data;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
2. Constraint-Based Pattern Retargeting for Reducing Localized Power Activity During Testing;2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS);2018-04
3. Access-in-turn test architecture for low-power test application;International Journal of Electronics;2016-08-13
4. Isometric Test Data Compression;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2015-11
5. High-Quality Statistical Test Compression With Narrow ATE Interface;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2013-09