Author:
Dhotre Harshad,Eggersgluss Stephan,Drechsler Rolf,Dehbashi Mehdi,Pfannkuchen Ulrike
Cited by
2 articles.
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1. Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling;2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC);2023-12-18
2. Test-Friendly Data-Selectable Self-Gating (DSSG);IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-08