Contribution of sintering process to the reliability of X7R BME-MLCCs with high-voltage-Reference-Cited by-同舟云学术

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Contribution of sintering process to the reliability of X7R BME-MLCCs with high-voltage

Published:2023-08-08 Issue: Volume:150 Page:1-5
ISSN:
Container-title:2023 24th International Conference on Electronic Packaging Technology (ICEPT)
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Author:

Jian Gang¹,Zhang Lei¹,Yu Shuhui¹,Sun Rong¹,Fu Zhenxiao²,Cao Xiuhua²

Affiliation:

1. Materials Shenzhen Institute of Advanced Technology Chinese Academy of Sciences,Shenzhen Institute of Advanced Electronic,Shenzhen,China

2. Guangdong Fenghua Advanced Technology Holding Co., Ltd.,State Key Laboratory of Advanced Materials and Electronic Components,Zhaoqing,China

Funder

Natural Science Foundation of Guangdong Province

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10491594/10491891/10492303.pdf?arnumber=10492303

Reference8 articles.

1. Improved reliability predictions in high permittivity dielectric oxide capacitors under high dc electric fields with oxygen vacancy induced electromigration

2. The inner electrode structure optimization of high voltage MLCCs;Gui

3. Electric Field-Dependent Properties of BaTiO3-Based Multilayer Ceramic Capacitors

4. Structural and Dielectric Properties in (1−x )BaTiO3 -x Bi(Mg1/2 Ti1/2 )O3 Ceramics (0.1 ≤ x ≤ 0.5) and Potential for High-Voltage Multilayer Capacitors

5. Perspectives and challenges in multilayer ceramic capacitors for next generation electronics

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