Structural and Dielectric Properties in (1−x )BaTiO3 -x Bi(Mg1/2 Ti1/2 )O3 Ceramics (0.1 ≤ x ≤ 0.5) and Potential for High-Voltage Multilayer Capacitors-Reference-Cited by-同舟云学术

Structural and Dielectric Properties in (1−x )BaTiO3 -x Bi(Mg1/2 Ti1/2 )O3 Ceramics (0.1 ≤ x ≤ 0.5) and Potential for High-Voltage Multilayer Capacitors

Published:2013-04-10 Issue:7 Volume:96 Page:2197-2202
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J. Am. Ceram. Soc.

Author:

Choi Doo Hyun¹,Baker Amanda¹,Lanagan Michael¹,Trolier-McKinstry Susan¹,Randall Clive¹

Affiliation:

1. Center for Dielectric Studies; Materials Research Institute; The Pennsylvania State University; University Park Pennsylvania 16802

Funder

Air Force Research Laboratory

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jace.12312/fullpdf

Reference21 articles.

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3. BaTiO3-Bi (Zn1/2Ti1/2) O3-BiScO3 Ceramics for High-Temperature Capacitor Applications;Raengthon;J. Am. Ceram. Soc.,2012

4. Structural and Electrical Characterization of xBiScO3-(1−x) BaTiO3 Thin Films;Tinberg;J. Appl. Phys.,2007

5. Weakly Coupled Relaxor Behavior of BaTiO3-BiScO3 Ceramics;Ogihara;J. Am. Ceram. Soc.,2009

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