Improved reliability predictions in high permittivity dielectric oxide capacitors under high dc electric fields with oxygen vacancy induced electromigration-Reference-Cited by-同舟云学术

Improved reliability predictions in high permittivity dielectric oxide capacitors under high dc electric fields with oxygen vacancy induced electromigration

Published:2013-01-07 Issue:1 Volume:113 Page:014101
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Randall C. A.,Maier R.,Qu W.,Kobayashi K.,Morita K.,Mizuno Y.,Inoue N.,Oguni T.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4772599

Reference42 articles.

1. dc Electrical Degradation of Perovskite-Type Titanates: I, Ceramics

2. Charge Carriers and Time Dependent Currents in BaTiO<inf>3</inf>-Based Ceramic

3. Bulk Conductivity and Defect Chemistry of Acceptor-Doped Strontium Titanate in the Quenched State

4. Base-Metal Electrode-Multilayer Ceramic Capacitors: Past, Present and Future Perspectives

5. Degradation of Mn-doped BaTiO3 ceramic under a high d.c. electric field

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