1. Vmin Testing under Variations: Defect vs. Fault Coverage;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09
2. Robust Pattern Generation for Small Delay Faults Under Process Variations;2023 IEEE International Test Conference (ITC);2023-10-07
3. Path controllability analysis for high quality designs;Proceedings of the 24th Asia and South Pacific Design Automation Conference;2019-01-21
4. Evaluating the Effectiveness of D-chains in SAT-based ATPG and Diagnostic TPG;Journal of Electronic Testing;2017-12
5. On Generation of Delay Test with Capture Power Safety;Communications in Computer and Information Science;2017