Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers-Reference-Cited by-同舟云学术

Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

Published:2023 Issue: Volume:4 Page:70-84
ISSN:2644-1225
Container-title:IEEE Open Journal of Circuits and Systems
language:
Short-container-title:IEEE Open J. Circuits Syst.

Author:

Nel Hendrik P.¹^ORCID,Dualibe Fortunato Carlos²^ORCID,Stander Tinus¹^ORCID

Affiliation:

1. Department for Electrical, Electronic and Computer Engineering, Carl and Emily Fuchs Institute for Microelectronics, University of Pretoria, Pretoria, South Africa

2. Electronics and Microelectronics Department, Polytechnic Faculty, Université de Mons, Mons, Belgium

Funder

NRF/F.RS.-FNRS South Africa—Wallonia Joint Science and Technology Research Collaboration

NRF

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Medicine

Link

http://xplorestaging.ieee.org/ielx7/8784029/10019301/10002329.pdf?arnumber=10002329

Reference64 articles.

1. Evaluation of Analog/RF Test Measurements at the Design Stage

2. 360‐μW 4.1‐dB NF CMOS MedRadio receiver RF front‐end with current‐reuse Q ‐boosted resistive feedback LNA for biomedical IoT applications

3. Sensors for built-in alternate RF test

4. PVT ‐compensated low‐voltage and low‐power CMOS LNA for IoT applications

5. Oscillation-based Test for Measuring 1dB Gain Compression Point of Power Amplifiers

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