Evaluation of Analog/RF Test Measurements at the Design Stage-Reference-Cited by-同舟云学术

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Evaluation of Analog/RF Test Measurements at the Design Stage

Published:2009-04 Issue:4 Volume:28 Page:582-590
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Stratigopoulos H.-G.,Mir S.,Bounceur A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx5/43/4802215/04802222.pdf?arnumber=4802222

Cited by 26 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers;IEEE Open Journal of Circuits and Systems;2023

2. Functional Testing of On-chip Analog/RF Circuits using Machine Learning based Regression Models;2022 IEEE International Test Conference India (ITC India);2022-07-24

3. Risk Analysis by a Probabilistic Model of the Measurement Process;Sensors;2021-03-15

4. Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate Extreme Value Model;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-05

5. Gaussian Process-Based Wafer-Level Correlation Modeling and Its Applications;Machine Learning in VLSI Computer-Aided Design;2019

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