A Novel Method for Remaining Useful Life Prediction of RF Circuits Based on the Gated Recurrent Unit–Convolutional Neural Network Model

Abstract

The remaining useful life (RUL) prediction of RF circuits is an important tool for circuit reliability. Data-driven-based approaches do not require knowledge of the failure mechanism and reduce the dependence on knowledge of complex circuits, and thus can effectively realize RUL prediction. This manuscript proposes a novel RUL prediction method based on a gated recurrent unit–convolutional neural network (GRU-CNN). Firstly, the data are normalized to improve the efficiency of the algorithm; secondly, the degradation of the circuit is evaluated using the hybrid health score based on the Euclidean and Manhattan distances; then, the life cycle of the RF circuits is segmented based on the hybrid health scores; and finally, an RUL prediction is carried out for the circuits at each stage using the GRU-CNN model. The results show that the RMSE of the GRU-CNN model in the normal operation stage is only 3/5 of that of the GRU and CNN models, while the prediction uncertainty is minimized.