Software Reliability Growth Models with Testing-Effort-Reference-Cited by-同舟云学术

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Software Reliability Growth Models with Testing-Effort

Published:1986 Issue:1 Volume:35 Page:19-23
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:
Short-container-title:IEEE Trans. Rel.

Author:

Yamada Shigeru,Ohtera Hiroshi,Narihisa Hiroyuki

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx5/24/4335320/04335332.pdf?arnumber=4335332

Cited by 174 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Developing an Innovative Imperfect Debugging Software Reliability Growth Model with Enhanced Testing Coverage Strategies;International Journal of Reliability, Quality and Safety Engineering;2024-06-17

3. An SRGM Using Fault Removal Efficiency and Correction Lag Function;International Journal of Reliability, Quality and Safety Engineering;2024-06-11

4. Empowering software reliability: Leveraging efficient fault detection and removal efficiency;Quality Engineering;2024-05-30

5. A Software Reliability Model Considering a Scale Parameter of the Uncertainty and a New Criterion;Mathematics;2024-05-23

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