Fault diagnosis in scan-based BIST using both time and space information-Reference-Cited by-同舟云学术

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Fault diagnosis in scan-based BIST using both time and space information

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Container-title:International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034)
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Author:

Ghosh-Dastidar J.,Das D.,Touba N.A.

Publisher

Int. Test. Conference

Link

http://xplorestaging.ieee.org/ielx5/6540/17459/00805618.pdf?arnumber=805618

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Novel Test Data Compaction Method with Improved Debug Capabilities of the Signatures;2023 IEEE International Test Conference India (ITC India);2023-07-23

2. Test cost reduction through increase in multi-site testing with reduced scan-out pins;2019 IEEE International Test Conference India (ITC India);2019-07

3. On-chip MISR Compaction Technique to Reduce Diagnostic Effort and Test Time;2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID);2019-01

4. Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs;Journal of Electronic Testing;2011-08-26

5. Diagnosis of Failing Scan Cells through Orthogonal Response Compaction;2011 Sixteenth IEEE European Test Symposium;2011-05

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