Author:
Benware Brady,Mrugalski Grzegorz,Pogiel Artur,Rajski Janusz,Solecki Jędrzej,Tyszer Jerzy
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference33 articles.
1. Bayraktaroglu I, Orailoglu A (2005) The construction of optimal deterministic partitioning in scan-based BIST fault diagnosis: mathematical foundations and cost-effective implementations. IEEE Trans Comput 54(1):61–75
2. Benware B, Mrugalski G, Pogiel A, Rajski J, Solecki J, Tyszer J (2010) “Diagnosis of failing scan cells through orthogonal response compaction.” Proc. ETS. 221–226
3. Chan JC, Abraham JA (1990) “A study of faulty signatures using a matrix formulation.” Proc. ITC. 553–561
4. Chan JC, Womack BF (1990) “A study of faulty signature for diagnostics.” Proc. ISCAS. 2701–2704
5. Czysz D, Mrugalski G, Mukherjee N, Rajski J, Tyszer J (2010) On compaction utilizing inter and intra correlation of unknown states. IEEE Trans Computer-Aided Design 29(1):117–126
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