Author:
Czysz Dariusz,Mrugalski Grzegorz,Mukherjee Nilanjan,Rajski Janusz,Tyszer Jerzy
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
18 articles.
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1. X-Masking for Deterministic In-System Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. DIST: Deterministic In-System Test with X-masking;2022 IEEE International Test Conference (ITC);2022-09
3. X-Masking for In-System Deterministic Test;2022 IEEE European Test Symposium (ETS);2022-05-23
4. X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-08
5. X-Tolerant Tunable Compactor for In-System Test;2020 IEEE International Test Conference (ITC);2020-11-01