Funder
Polish Ministry of Education and Science
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
6 articles.
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1. An in-Array Build-In Self-Test Scheme for Embedded SRAM Array;IEEE Transactions on Circuits and Systems II: Express Briefs;2024-08
2. X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
3. X-Masking for Deterministic In-System Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
4. Design and Performance Comparison of X-Masking Models in DFT Applications;2023 8th International Conference on Communication and Electronics Systems (ICCES);2023-06-01
5. DIST: Deterministic In-System Test with X-masking;2022 IEEE International Test Conference (ITC);2022-09