Funder
Polish Ministry of Education and Science
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. X-Masking for Deterministic In-System Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. Design and Performance Comparison of X-Masking Models in DFT Applications;2023 8th International Conference on Communication and Electronics Systems (ICCES);2023-06-01
3. DIST: Deterministic In-System Test with X-masking;2022 IEEE International Test Conference (ITC);2022-09
4. A New, Fast Pseudo-Random Pattern Generator for Advanced Logic Built-In Self-Test Structures;Applied Sciences;2021-10-12