Author:
Vinnakota B.,Wanli Jiang ,Dechang Sun
Cited by
19 articles.
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1. Scaling of iDDT Test Methods for Random Logic Circuits;Journal of Electronic Testing;2006-02
2. I
DDX
-based test methods;ACM Transactions on Design Automation of Electronic Systems;2004-04
3. Calibrating power supply signal measurements for process and probe card variations;Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004);2004
4. Power supply transient signal analysis for defect-oriented test;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2003-03
5. On faster I-DDQ measurements;Journal of Electronic Testing;2003