Author:
Zhiyuan Wang ,Marek-Sadowska M.,Tsai K.-H.,Rajski J.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
26 articles.
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1. Diagnosis of Double Faults Consisting of a Stuck-at Fault and a Transition Fault;2024 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC);2024-07-02
2. Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift;Journal of Electronic Testing;2023-04
3. New Targets for Diagnostic Test Generation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
4. An Automatic Test Pattern Generation Method for Multiple Stuck-At Faults by Incrementally Extending the Test Patterns;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
5. Diagnosis technique for Clustered Multiple Transition Delay Faults;2020 IEEE International Test Conference in Asia (ITC-Asia);2020-09