Diagnosis technique for Clustered Multiple Transition Delay Faults-Reference-Cited by-同舟云学术

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Diagnosis technique for Clustered Multiple Transition Delay Faults

Published:2020-09 Issue: Volume: Page:
ISSN:
Container-title:2020 IEEE International Test Conference in Asia (ITC-Asia)
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Author:

You Yan-Shen,Liu Chih-Yan,Wu Mu-Ting,Chen Po-Wei,Li James Chien-Mo

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9222394/9226537/09226559.pdf?arnumber=9226559

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Diagnosis of Double Faults Consisting of a Stuck-at Fault and a Transition Fault;2024 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC);2024-07-02

2. Gradient Boosting-Accelerated Evolution for Multiple-Fault Diagnosis;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25

3. Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-02

4. Early Detection of Clustered Trojan Attacks on Integrated Circuits Using Transition Delay Fault Model;Cryptography;2023-01-28

5. Unsupervised Root-Cause Analysis with Transfer Learning for Integrated Systems;2021 IEEE 39th VLSI Test Symposium (VTS);2021-04-25

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