Author:
Tahoori Mehdi B.,Mitra Subhasish
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
11 articles.
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4. Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs;2018 28th International Conference on Field Programmable Logic and Applications (FPL);2018-08
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