Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs-Reference-Cited by-同舟云学术

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Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs

Published:2018-08 Issue: Volume: Page:
ISSN:
Container-title:2018 28th International Conference on Field Programmable Logic and Applications (FPL)
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Author:

Ahmed Ibrahim,Zhao Shuze,Meijers James,Trescases Olivier,Betz Vaughn

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8529150/8530786/08533470.pdf?arnumber=8533470

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ada-FA: A Comprehensive Framework for Adaptive Fault Tolerance and Aging Mitigation in FPGAs;IEEE Internet of Things Journal;2024-05-15

2. A Survey of FPGA Optimization Methods for Data Center Energy Efficiency;IEEE Transactions on Sustainable Computing;2023-07-01

3. Future Internet of Things: Connecting the Unconnected World and Things Based on 5/6G Networks and Embedded Technologies;Internet of Things - New Trends, Challenges and Hurdles;2023-02-08

4. FODM: A Framework for Accurate Online Delay Measurement Supporting All Timing Paths in FPGA;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-04

5. AM&FT: An Aging Mitigation and Fault Tolerance Framework for SRAM-Based FPGA in Space Applications;Journal of Circuits, Systems and Computers;2022-02-14

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