Author:
Nechay Bettina,Howell Robert,Stewart Eric,Parke Justin,Freitag Ron,Cramer Harlan,King Matthew,Gupta Shalini,Hartman Jeff,Borodulin Pavel,Snook Megan,Wathuthanthri Ishan,Renaldo Karen,Henry H. George
Cited by
7 articles.
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1. Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03
2. SLCFET Amplifier Performance Improvements Using an ALD TiN T-Gate Process;2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2022-10-16
3. Frequency Performance Improvements for SLCFET Amplifier Through Device Scaling;2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2021-12-05
4. GaN power switches on the rise: Demonstrated benefits and unrealized potentials;Applied Physics Letters;2020-03-02
5. Diamond Superjunction (SJ) Process Development: Super-Lattice Power Amplifier with Diamond Enhanced Superjunction (SPADES);2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS);2019-11