Time-dependent-dielectric-breakdown measurements of thermal oxides on n-type 6H-SiC-Reference-Cited by-同舟云学术

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Time-dependent-dielectric-breakdown measurements of thermal oxides on n-type 6H-SiC

Published:1999-03 Issue:3 Volume:46 Page:520-524
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Mathur M.M.,Cooper J.A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx4/16/16167/00748871.pdf?arnumber=748871

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