Multi-level simulation of large analog systems containing behavioral models
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Link
http://xplorestaging.ieee.org/ielx1/43/7786/00329267.pdf?arnumber=329267
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Low-Threshold II–VI Lattice-Matched SWS-FETs for Multivalued Low-Power Logic;Journal of Electronic Materials;2021-03-05
2. Behavioral Modeling;Encyclopedia of Information Science and Technology, Third Edition;2015
3. Behavioral Fault Modeling and Simulation Using VHDL-AMS to Speed-Up Analog Fault Simulation;Analog Integrated Circuits and Signal Processing;2004-05
4. Behavioral Testing of Mixed-Signal Circuits;Test and Design-for-Testability in Mixed-Signal Integrated Circuits;2004
5. Behavioral test generation modeling approach for mixed-signal IC verification;Microelectronics Journal;2003-10
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