Author:
Ferrandi F.,Fummi F.,Sciuto D.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
13 articles.
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1. Test generation at the algorithm-level for gate-level fault coverage;Microelectronics Reliability;2008-07
2. A CLP-Based Functional ATPG for Extended FSMs;2007 Eighth International Workshop on Microprocessor Test and Verification;2007-12
3. Logic-level mapping of high-level faults;Integration;2005-01
4. Test Generation: A Heuristic Approach;System-level Test and Validation of Hardware/Software Systems;2005
5. Test Generation: A Symbolic Approach;System-level Test and Validation of Hardware/Software Systems;2005