Extrapolation Method of On-Orbit Soft Error Rates of EDAC SRAM Devices From Accelerator-Based Tests

Author:

Zhang ZhangangORCID,Lei Zhifeng,Zhao Guilin,Juan Yang,He Yujuan,Peng Chao,Liu Yuan,Shi Qian,Huang Yun,En Yunfei

Funder

National Natural Science Foundation of China

Science and Technology Research Project of Guangdong, China

Science and Technology Plan Project of Guangzhou, China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Tool for Automatic Radiation-Hardened SRAM Layout Generation;2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS);2023-12-04

2. A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications;IEEE Transactions on Circuits and Systems I: Regular Papers;2023-12

3. A Novel Circuit and Layout Design of SEU Tolerant SRAM in a 65nm CMOS Process;2023 IEEE 18th Conference on Industrial Electronics and Applications (ICIEA);2023-08-18

4. A MCU-robust Interleaved Data/Detection SRAM for Space Environments;2023 IEEE Computer Society Annual Symposium on VLSI (ISVLSI);2023-06-20

5. An SRAM-based Multiple Event Upsets Detection Method for Space Applications;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03

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