A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications-Reference-Cited by-同舟云学术

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A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications

Published:2023-12 Issue:12 Volume:70 Page:4877-4887
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Brendler Leonardo H.¹^ORCID,Lapuyade Hervé²,Deval Yann²^ORCID,Darracq Frédéric²,Fauquet Frédéric¹,Reis Ricardo³^ORCID,Rivet François²^ORCID

Affiliation:

1. Instituto de Informática, Universidade Federal do Rio Grande do Sul—UFRGS (PGMicro), Porto Alegre, Brazil

2. IMS Laboratory, University of Bordeaux, Talence, France

3. Instituto de Informática, Universidade Federal do Rio Grande do Sul—UFRGS (PGMicro/PPGCC), Porto Alegre, Brazil

Funder

Brazilian National Council of Scientific and Technological Development

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture

Link

http://xplorestaging.ieee.org/ielx7/8919/10363413/10250889.pdf?arnumber=10250889

Reference27 articles.

1. Radiation Effects on Embedded Systems

2. Space Environments

3. Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

4. Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule

5. Impact of the Bitcell Topology on the Multiple-Cell Upsets Observed in VLSI Nanoscale SRAMs

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Tool for Automatic Radiation-Hardened SRAM Layout Generation;2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS);2023-12-04

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