Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
13 articles.
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1. Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies;IEICE Transactions on Electronics;2024-07-01
2. Low power low voltage TSPC FLIP-FLOP design;AIP Conference Proceedings;2024
3. A novel low power single phase clocking flipflop design for biomedical applications;PHYSICAL MESOMECHANICS OF CONDENSED MATTER: Physical Principles of Multiscale Structure Formation and the Mechanisms of Nonlinear Behavior: MESO2022;2023
4. Low Power Flip-Flop Design with Reduced Leakage using Sleepy Stack and Stack Power Gating Technique;2022 6th International Conference on Electronics, Communication and Aerospace Technology;2022-12-01
5. Soft-error Tolerance by Guard-Gate Structures on Flip-Flops in 22/65 nm FD-SOI Technologies;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03