Impact of Thermal Annealing and Other Process Parameters on Hybrid Bonding Performance for 3D Advanced Assembly Technology

Author:

Ajayi Taiwo1,Gatimu Alvin2,Brun Xavier F.1,Woods Chris1,Song Kay3,Bhat Abhishek3,Galande Charudatta3,Le Phillip3,Karim Zia3

Affiliation:

1. Intel Corporation,Chandler,Arizona,USA

2. Intel Corporation,Hillsboro,Oregon,USA

3. YES (Yield Engineering Systems),Fremont,California,USA

Publisher

IEEE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Thermodynamic modeling framework with experimental investigation of the large-scale bonded area and local void in Cu-Cu bonding interface for advanced semiconductor packaging;International Journal of Plasticity;2024-09

2. Annealing Effects in Sub-8 μm Pitch Die-to-Wafer Hybrid Bonding;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

3. State of the Art of Cu–Cu Hybrid Bonding;IEEE Transactions on Components, Packaging and Manufacturing Technology;2024-03

4. Cu-Cu Hybrid Bonding;Flip Chip, Hybrid Bonding, Fan-In, and Fan-Out Technology;2024

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