Terahertz Near-Field Microscope: Analysis and Measurements of Scattering Signals-Reference-Cited by-同舟云学术

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Terahertz Near-Field Microscope: Analysis and Measurements of Scattering Signals

Published:2011-09 Issue:1 Volume:1 Page:164-168
ISSN:2156-342X
Container-title:IEEE Transactions on Terahertz Science and Technology
language:
Short-container-title:IEEE Trans. Terahertz Sci. Technol.

Author:

Moon Kiwon,Jung Euna,Lim Meehyun,Do Youngwoong,Han Haewook

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Radiation

Link

http://xplorestaging.ieee.org/ielx5/5503871/6005317/06005332.pdf?arnumber=6005332

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Terahertz nanoscopy: Advances, challenges, and the road ahead;Applied Physics Reviews;2024-04-10

2. Reference-free self-calibrating tip-based scattering-type THz near-field microscopy;AIP Advances;2023-06-01

3. Direct visualization of carbon black aggregates in nitrile butadiene rubber by THz near-field microscope;Scientific Reports;2023-05-15

4. GO/PO Method for the Terahertz Scattering Computation of Objects With Multiple Small-Scale Grooves;IEEE Access;2019

5. The Role of Scattering in Quasi-Ordered Structures for Terahertz Imaging: Local Order Can Increase an Image Quality;IEEE Transactions on Terahertz Science and Technology;2018-07

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