Design and Evaluation of a Near-Sensor Magneto-Electric FET-Based Event Detector-Reference-Cited by-同舟云学术

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Design and Evaluation of a Near-Sensor Magneto-Electric FET-Based Event Detector

Published:2023-09 Issue:9 Volume:70 Page:4822-4828
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Morsali Mehrdad¹,Tabrizchi Sepehr²^ORCID,Marshall Andrew³,Roohi Arman²^ORCID,Misra Durga¹^ORCID,Angizi Shaahin¹^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, New Jersey Institute of Technology, Newark, NJ, USA

2. School of Computing, University of Nebraska--Lincoln, Lincoln, NE, USA

3. Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA

Funder

National Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

https://ieeexplore.ieee.org/ielam/16/10227840/10196416-aam.pdf

Reference22 articles.

1. Low-Resistance 2D/2D Ohmic Contacts: A Universal Approach to High-Performance WSe2, MoS2, and MoSe2 Transistors

2. Benchmarking of Beyond-CMOS Exploratory Devices for Logic Integrated Circuits

3. Modeling of Nanoscale Devices

4. Evolving magneto-electric device technologies

5. MeF-RAM: A New Non-Volatile Cache Memory Based on Magneto-Electric FET

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Hybrid Magneto-electric FET-CMOS Integrated Memory Design for Instant-on Computing;Proceedings of the Great Lakes Symposium on VLSI 2024;2024-06-12

2. Enabling Normally-Off In Situ Computing With a Magneto-Electric FET-Based SRAM Design;IEEE Transactions on Electron Devices;2024-04

3. Deep Mapper: A Multi-Channel Single-Cycle Near-Sensor DNN Accelerator;2023 IEEE International Conference on Rebooting Computing (ICRC);2023-12-05

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