Influence of BCB Protection on Irradiation Response of InP-Based HEMTs: A Comparative Study
Author:
Affiliation:
1. School of Physics and Microelectronics, Zhengzhou University, Zhengzhou, China
2. China Academy of Space Technology (CAST), Beijing, China
3. Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China
Funder
National Natural Science Foundation of China
Natural Science Foundation of Henan Province
Promotion Funding for Excellent Young Backbone Teacher of Henan Province in China
Program for Innovative Cooperation Team of Yong Talent and Enterprise in Zhengzhou University of China
Program for Professor Team to Help the Innovation-Driven Development of Enterprise in Zhengzhou University of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/16/10194493/10168052.pdf?arnumber=10168052
Reference33 articles.
1. Impact of Surface Passivation on the Dynamic ON-Resistance of Proton-Irradiated AlGaN/GaN HEMTs
2. Effect of Surface Passivation and Substrate on Proton Irradiated AlGaN/GaN HEMT Transport Properties
3. Millimeter-Wave GaN HEMTs With Cavity-Gate Structure Using MSQ-Based Inter-Layer Dielectric
4. Influence of Poly-AlN Passivation on the Performance Improvement of 3-MeV Proton-Irradiated AlGaN/GaN MIS-HEMTs
5. SRIM – The stopping and range of ions in matter (2010)
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